Forms a highly graphitized, uniform, and thin carbon layer on the surface of LFP/LMFP, enhancing the conductivity and electrode compaction density of the cathode material |
Prevents precursor particle agglomeration during drying process, suppresses excessive grain growth of the cathode material, and controls particle size distribution |
High purity, easily water-soluble, and compatible with both solid-phase and liquid-phase production processes |
Low content of magnetic particles, Cu/Zn particles, and Na/K impurity elements |
Property | Indicator | Testing Method |
Appearance | White Tablets | Visual |
Water Content/% | ≤1.0 | GB/T7380 |
PH Value | 5.0 - 7.0 | GB/T6368-2008 (1% Water based solvent) |
· Low content of magnetic particles, Cu/Zn particles, and Na/K impurities
PEG | Onset Thermal Decomposition Temperature / ℃ | Carbon Residue / % |
PEG1500 | 150 | 3.1 |
PEG2000 | 300 | 5.2 |
PEG4000 | 300 | 5.1 |
PEG6000 | 300 | 5.1 |
·Dosage: 1–8% of Precursor WT%